MICROSCOPY: SCIENCE, TECHNOLOGY,

APPLICATIONS AND EDUCATION

MICROSCOPY BOOK SERIES - Number 4
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CONTENTS VOL. 3 (pp. 1580-2200)

 
Cover VOL. 3
ISBN-Table of Contents

Introduction

 
Applications in Physical/Chemical Sciences
 

Basic Principles and Application of Electron Channeling in a Scanning Electron Microscope for Dislocation Analysis

R. J. Kamaladasa and Y.N. Picard

 

Bloch wave analysis of electron beam scattering mechanisms by a dopant atom

B.G. Mendis

 

Near field emission scanning electron microscopy

T.L. Kirk

 

Surface Electron Microscopy of Ga Droplet Dynamics on GaAs (001)

D. E. Jesson and W. X. Tang

 

Microstructure and Coercivity Correlationship in Soft Magnetic Nanocrystalline Alloys

Juan José del Val and Julián González


Atomic structures and properties of boron nitride nanomaterials

Takeo Oku

 

Scanning electron microscopy of natural rubber surfaces: quantitative statistical and spectral texture analysis using digital image processing

D. K. Setua, R. Awasthi, S. Kumar, M. Prasad and K. Agarwal

 

Microstructural characterization of lithium ion conductor by high resolution electron microscopy

T. Tsurui T. Katsumata and Y. Inaguma


Analysis of Li-Ion Battery Materials by Electron Energy Loss Spectroscopy

F. Cosandey

 

Study of Indium Tin Oxide Nanomaterials Obtained from Vapor Phase by Electron Microscopy

Marcelo Ornaghi Orlandi, Alexandre José Castro Lanfredi and Elson Longo

 

FESEM and HRTEM studies of some novel carbon nanostructures

D. Banerjee, A. Jha and K. K. Chattopadhyay

 

Analyzing growth kinetics of magmatic crystals by backscattered electron microscopy of oriented crystal sections

R. Sturm

 

Determining the persistence length of biopolymers and rod-like macromolecular assemblies from electron microscope images and deriving some of their mechanical properties

Shlomo Trachtenberg and Ilan Hammel

 

Microscopic studies of electron and ion irradiated polymeric films

Vaibhav Kulshrestha, Garima Agarwal, Kamlendra Awasthi, Devendra Vyas and Y. K. Vijay

 

FIB-based target preparations of complex material systems for advanced TEM investigations

U. Muehle, S. Jansen, L.Hillmann, H.-J. Engelmann and D. Rafaja

 

Electron microscopy study of platinum nanoparticle catalysts supported on different carbon nanostructures for fuel cell applications

Lifeng Dong and Qianqian Liu

 

Structural characterization of lipid-based colloidal dispersions using cryogenic transmission electron microscopy

Stanislav Rangelov, Denitsa Momekova and Mats Almgren

 

Using TEM and SEM to unveil the role of nanoclays in polymer blends

M. F. Almeida, A.V. Machado and J. A. Covas

 

"Rear window": looking at charged particles hitting a charged target in a FIB/SEM

Marziale Milani, Hassan N. Abdul-Wahab, Tariq H. Abbood , C. Savoia and F. Tatti

 

Electron microscopy for understanding swift heavy ion irradiation effects on Electroactive polymers

A. Kumar, Somik Banerjee and M. Deka

 

Uses of Scanning Electrochemical Microscopy in Corrosion Research

R. M. Souto, S. V. Lamaka and S. González

 

Morphology Study by Using Scanning Electron Microscopy

Fei Liu, Junshu Wu, Kunfeng Chen and Dongfeng Xue

 

Nano-scale Plasma Etching-Hydrophilisation of Keratin fibres

W.Y.I. Tsoi, C.W. Kan, C.W.M. Yuen and T.B.Tang

 

Focused ion beam sample preparation for atom probe tomography

W.R. McKenzie, E.A. Marquis and P.R. Munroe

 

HRTEM Study of Oxide Nanoparticles in Fe-16Cr ODS Ferritic Steel Developed for Fusion Energy

Luke L. Hsiung

 

Structural determination of Zn-O dumbbells in facetted nano-particles

A.K. Srivastava, R. Gakhar, P. Dua, K. Senthil, J.S.Tawale, K.N. Sood and K. Yong

 

Use of electron backscattering coefficients for identification of Be-bearing

Phases

F. Zupanič, T. Bončina and B. Markoli

 

Analytical electron microscopy of gold nanoparticles on ceria, titania and ceria-titania materials

Sónia A. C. Carabineiro, Adrián M.T. Silva, Goran Dražić and José L. Figueiredo


Microscopy analysis of damaged aeronautical components

J.M. Silva, V. Infante, M. de Freitas and L. Reis


Low-Voltage Aberration-Corrected Transmission Electron Microscopy: Progressing Carbon Nanostructures

F. Börrnert, A. Bachmatiuk, B. Büchner and M. H. Rümmeli

 

TEM investigations of icosahedral quasicrystal in Al-based alloys

B. Markoli, T. Bončina and F. Zupanič

 

SEM Analysis of CO2 Laser Treated Cotton Grey Fabric

Y. L. Chow, C. K. Chan and C. W. Kan

 

Microscopic investigations of Synthetic Biomimetic Hydroxyapatite

N. Roveri, E. Foresti, M. Lelli, I. G. Lesci and M. Marchetti

 

Morphology and surface properties of natural fiber treated with electron beam

Seong Ok Han and Hae Young Choi

 

Using Transmission Electron Microscopy (TEM) for Chemical Analysis of Semiconductors

G.F. Iriarte

 

Partially Coherent Image Formation Theory for X-ray Microscopy

Chang Chang and Takashi Nakamura


Surface Characterization of Carbon Materials by X-ray Photoelectron Spectroscopy

Soo-Jin Park and Ki-Seok Kim

 

Application of white beam synchrotron radiation X-ray topography for in-situ study of ferroelectric domain structure

J. Xiao

 

Exploring the Properties and Interactions of Supported Lipid Bilayers on the Nanoscale by Atomic Force Microscopy

S. Morandat  and K. El Kirat

 

AFM study of the nanostructure of quenched isotactic polypropylene

Q. Zia, H.-J. Radusch and R. Androsch

 

Crystallographic image processing for scanning probe microscopy

P. Moeck

 

Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy

R. Arinero, C. Riedel, G. A. Schwartz, G. Lévêque, A. Alegría, Ph. Tordjeman,N. E. Israeloff, M. Ramonda and J. Colmenero

 

Estimation of percolation threshold of acid-etched titanium surfaces using Minkowski functionals

M.A. Rodríguez-Valverde, P.J. Ramón-Torregrosa and M.A. Cabrerizo-Vílchez


Combined use of AFM and FTIR in the analysis of the hydrogen termination of Si(100) surfaces

E. Romano, S. Trabattoni, M. Campione, E. Merati, A. Sassella and D. Narducci

 

Electrosynthesis and Characterization of Semiconducting Molecular Materials in the Electrochemical Module of the Atomic Force Microscope

M. E. Sánchez-Vergara, V. García-Montalvo, A. Moreno and J. R. Alvarez-Bada


Magnetization Controlling of Magnetic Probes in Spin-Polarized Scanning Tunneling Microscopy

Pin-Jui Hsu and Minn-Tsong Lin

 

Evaluation of nanomechanical properties of surfaces

Miyake S and Wang M

 

Characterization of MgO barrier by conducting atomic force microscopy

K. M. Bhutta

 

Applying an atomic force microscopy in the study of mineral flotation

Jinhong Zhang and Wei Zhang

 

A study on the surface roughness of electrodeposited silver thin films using a confocal laser scanning microscope

M. Saitou

 

Confocal Raman mapping study of a single nanowire

Sheng Yun Wu

 

Multidimensional Live Cell Imaging of Cancer-Mediated Events

Yingying Su, Renee Whan, Christophe Empsen, Lilian Soon and Filip Braet

 

Microscale chemical imaging using vibrational spectroscopy methods

Peter Wilhelm and Boril S. Chernev

 

Fluorescence anisotropy imaging microscopy

Lan Yao, James Segala, Anthony J.  Bucci, Gregory O. Andreev, Yana K. Reshetnyak and Oleg A. Andreev

 

Spectral unmixing of multiply stained fluorescence samples

T. Pengo, A. Muñoz-Barrutía and C. Ortiz-de-Solórzano


Epifluorescence light microscopy as a promising technique for studying the microstructure of wheat dough

S.H. Peighambardoust and M.R. Dadpour

 

Fluorescence immunohistochemistry in combination with DIC and transmission images of confocal LSM for studies of semi-ultrathin specimens of epoxy resin-embedded samples

S. Iwasaki and H. Aoyagi

 

Thermal and optical nanolithography using a scanning near-field optical microscopy

Eli Flaxer, Matvey Klebanov, Victor Lyubin, Michael Manevich and Salman Noach

 

Laser capture microdissection from formaldehyde-fixated and demineralized paraffin embedded tissues

T. Kaneko,  M.M.R. Cordeiro, T. Okiji, R. Kaneko,  H. Suda and J.E. Nör

 

Holographic methods for phase microscopic objects study

Tishko T. V., Tishko D. N. and Titar V. P

 

Time-Resolved Luminescence Microscopy and Microarray Using Europium Chelate Labels

K. Matsumoto

 

Investigations of distributions of point defect clusters in lopezite crystals by etch topography

M. Szurgot

 

The importance of microscopic analysis for accurate interpretation of chemical-induced cytotoxicity

M.J. Hazen, P. Fernández Freire, J.M. Pérez Martín, A. Peropadre, O. Herrero, L. Carvajal López and V. Labrador

 

Microscopy techniques to evaluate plasma modification on membranes for sterilization applications

C. Canal, S. Villeger, A. Ricard, A. Navarro, J.M. Canal

 

In-situ visualization of local corrosion by Scanning Ion-selective Electrode Technique (SIET)

SvetlanaV. Lamaka, Ricardo M. Souto and Mário G. S. Ferreira

 

Microscopic evaluation of diatomite for advanced applications: Case study

A.Q.Selim, A.A.El-Midany and S.S.Ibrahim

 

Microscopy and computerized image analysis of wood pulp fibres multi-scale structures

Gary Chinga-Carrasco

 

Surface nanofabrication using focused ion beam

Nan Yao and Alexander K Epstein

 

   

 



 

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